Faculté de médecine Faculté de médecine

TRANSMISSION ELECTRON MICROSCOPES

(TEMs)

FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE

(FIBSEM)

Tecnai 12 G²

(FEI, Eindhoven, Netherlands)

📅 Reservation 🏢 C06.1930.A ☎ 95 319

User manual

Contact Hervé Blanchard (☎ 95 263) for training before using TEMs

Tecnai TEM specification

Acceleration voltage: 80 kV
e^- source: W filament
MegaView III side-mounted CCD camera: 1376 × 1032 pix
- chip size: 10.2 × 10.2 mm²
- pixel size: 6.45 × 6.45 µm²
- pixel clock: 20.0 MHz
- dynamic range: 12 bit
- exposure time: 100 µs - 160 s
- scintillator: high sensitive phosphor
iTEM camera software (Olympus-Soft Imaging Solutions)
goniometer tilt: ±70°

Morgagni

(FEI, Eindhoven, Netherlands)

📅 Reservation 🏢 C06.1731.A ☎ 95 312

Contact Hervé Blanchard (☎ 95 263) for training before using TEMs

Morgagni TEM specification

Acceleration voltage: 80 kV
e^- source: W filament
Veleta side-mounted CCD camera: 2048 × 2048 pix
- chip size: 16.67 × 16.67 mm²
- pixel size: 7.4 × 7.4 µm²
- pixel clock: 24.6 MHz
- dynamic range: 14 bit
- exposure time: 100 µs - 160 s
- scintillator: high sensitive phosphor
iTEM camera software (Olympus-Soft Imaging Solutions)
goniometer tilt: ±70°

Helios 660 Nanolab DualBeam FIBSEM

(FEI, Eindhoven, Netherlands)

📅 Reservation 🏢 E01.3359.A ☎ 94 134

Contact Bohumil Maco (☎ 95 305) to analyse samples with this microscope

Helios FIBSEM specification

Acceleration voltage: 200 V - 30 kV
e^- source: Schottky thermal field emission gun (FEG)
Ion source: Ga⁺ liquid metal ion
Ion probe current: 0.6 pA - 65 nA
Ion vs. e^- geometry: 52°
Gas injection system (GIS): Pt, C
SEM imaging: up to 6144 × 4096 pix

FIB milling and imaging: Auto Slice and View (ASV 4.2) software
Tilling and stitching large FOV areas and CLEM: MAPS 3.3 software